This course will give students a quick review of terminology and theory behind noise parameters. Making noise parameter and noise figure measurements are critical for design of RFcomponents. We will look at common measurement techniques relative to theSmith Chart. The course provides clarity on optimum reflection, minimum signal loss and maximum signal admittance. Finally we will look at Y values and how recent techniques for SmithChart analysis can limit the number of Y measurements needed to accurately obtain noise parameter values for a given RFamplifier/receiver design.